Перегляд за автором "Prokhorov, I.A."

Сортувати за: Порядок: Результатів:

  • Shul’pina, I.L.; Kyutt, R.N.; Ratnikov, V.V.; Prokhorov, I.A.; Bezbakh, I.Zh.; Shcheglov, M.P. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2011)
    Using Si(As, P, B) and GaSb(Si) study, possibilities of X-ray diffraction methods for diagnostics of highly doped semiconductor crystals in characterization of dopant state – whether it is in the crystals in the form of ...