Перегляд за автором "Podanchuk, D.V."

Сортувати за: Порядок: Результатів:

  • Determination of surface defects by using the wavefront scanner 
    Goloborodko, N.S.; Grygoruk, V.I.; Kurashov, V.N.; Podanchuk, D.V.; Goloborodko, A.A.; Kotov, M.M. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2010)
    The possibility of changes in the polarization state of the laser beam reflected from inhomogeneity with the refractive index gradient is theoretically shown, which allows separating the phase shifts related with relief ...
  • Shack-hartmann wavefront sensor with holographic lenslet array for the aberration measurements in a speckle field 
    Podanchuk, D.V.; Kurashov, V.N.; Dan’ko, V.P.; Kotov, M.M.; Sutyagina, N.S. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2008)
    The application of a Shack-Hartmann sensor with holographic lenslet array to the measurements of wavefront aberrations in a speckle field is offered. The main feature of the method is that the tested wave front can be ...