Перегляд за автором "Pavlova, E.P."

Сортувати за: Порядок: Результатів:

  • Kudryavtsev, Y.V.; Lee, Y.P.; Hyun, Y.H.; Pavlova, E.P.; Makogon, Y.N. (Functional Materials, 2005)
    The work aim is to demonstrate the potential of the spectroscopic ellipsometry (SE) approach to study the solid state reactions, both spontaneous and/or induced by thermal annealing, in (3.0 nm Co / 10.6 nm Si)₂₀ multilayered ...
  • Makogon, Iu.N.; Pavlova, E.P.; Sidorenko, S.I.; Beddies, G.; Beke, D.L.; Csik, A.; Verbitska, T.I.; Fihurna, E.V.; Shkarban, R.A. (Functional Materials, 2013)
    The influence of Pt on solid state reactions in Ni (30 nm)/Pt(x) /Siep.(50 nm)/ Si (001) (x=2 nm, 6 nm) nanodimensional films has been investigated. The layers of Pt and Ni were produced by magnetron sputtering ...
  • Sidorenko, S.I.; Makogon, Yu.N.; Pavlova, E.P.; Voloshko, S.M. (Functional Materials, 2009)
    The formation of heterostructures based on nanoscale silicide films in limiting states are exemplified. The nanoscale silicide films of a required phase composition are shown to be obtainable by formation of specific zones, ...
  • Kudryavtsev, Yu.V.; Uvarov, V.M.; Gontarz, R.; Dubowik, J.; Lee, Y.P.; Rhee, J.Y.; Makogon, Yu.N.; Pavlova, E.P. (Успехи физики металлов, 2005)
    The aim of the paper is to show the potential of the spectroscopic ellipsometry and magnetooptical (MO) spectroscopy for probing of the multilayered films (MLF) with sublayer thickness of about a few nanometres. The main ...