Lytvyn, P.M.; Olikh, O.Ya.; Lytvyn, O.S.; Dyachyns’ka, O.M.; Prokopenko, I.V.
(Semiconductor Physics Quantum Electronics & Optoelectronics, 2010)
Demonstrated experimentally in this work was the possibility of controlled
handling the nanoparticles with the size from 50 up to 250 nm on a semiconductor
surface by using an atomic force microscope under conditions ...