Donets, V.V.; Melnichenko, L.Y.; Shaykevich, I.A.; Lomakina, O.V.
(Semiconductor Physics Quantum Electronics & Optoelectronics, 2009)
Offered in this work is the method to determine the thickness and refractive
index dispersion of thin antireflection films on absorbing substrates by using a spectral
dependence of reflectivity at normal light incidence. ...