Pershyn, Y.P.; Chumak, V.S.; Shypkova, I.G.; Mamon, V.V.; Devizenko, A.Yu.; Kondratenko, V.V.; Reshetnyak, M.V.; Zubarev, E.N.
(Вопросы атомной науки и техники, 2018)
WC/Si multilayer X-ray mirrors (MXMs) with nominal layers thicknesses of 0.2…30.3 nm (periods: 0.7…38.9 nm) were deposited by direct current magnetron sputtering and studied by X-ray diffraction and cross-sectional ...