Перегляд за автором "Lomakina, O.V."

Результати 1-2 з 2

Determination of refractive index dispersion and thickness of thin antireflection films TiO₂ and Si₃N₄ on surfaces of silicon photoelectric converters

Donets, V.V.; Melnichenko, L.Y.; Shaykevich, I.A.; Lomakina, O.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2009)

Offered in this work is the method to determine the thickness and refractive index dispersion of thin antireflection films on absorbing substrates by using a spectral dependence of reflectivity at normal light incidence. ...
Optical properties of thin films of titanium with transient layers on them

Lendel, V.V.; Lomakina, O.V.; Mel’nychenko, L.Yu.; Shaykevich, I.A. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2010)

Within the Beattie spectroellipsometric method, we measured the ellipsometric parameters of thin Ті films deposited onto glass substrates by magnetron sputtering in argon atmosphere. Measurements were carried out at five ...

Результати 1-2 з 2

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