Liubchenko, O.I.; Kladko, V.P.
(Металлофизика и новейшие технологии, 2018)
A detailed XRD analysis of AlN/GaN multiple quantum well (MQW) structures grown on AlN(0001) substrates is proposed. The effect of roughness on the 2θ-ω scans measured in Bragg diffraction for symmetrical reflections is ...