Litvinov, V.A.; Okseniuk, I.I.; Shevchenko, D.I.; Bobkov, V.V.
(Вопросы атомной науки и техники, 2022)
Secondary ion mass spectrometry (SIMS) analysis is used to investigate the composition of surface monolayers of the hydride forming intermetallic TiFe alloy during its interaction with oxygen. Oxygen, which is chemisorbed ...