Vladimirova, T.P.; Kyslovs’kyy, Ye.M.; Molodkin, V.B.; Olikhovskii, S.I.; Koplak, O.V.; Kochelab, E.V.
(Semiconductor Physics Quantum Electronics & Optoelectronics, 2011)
Quantitative characterization of complex microdefect structures in annealed
silicon crystals (1150 °С, 40 h) and their transformations after exposing for one day in a
weak magnetic field (1 T) has been performed by ...