Izhnin, I.I.; Bogoboyashchyy, V.V.; Kurbanov, K.R.; Mynbaev, K.D.; Ryabikov, V.M.
(Semiconductor Physics Quantum Electronics & Optoelectronics, 2005)
The dependence of the conversion depth in CdxHg₁–xTe alloys subjected to ion-beam milling (CMT) on alloy composition and treatment temperature is studied both experimentally and theoretically. It is shown that in compositionally ...