Dmitruk, N.L.; Fursenko, O.V.; Kondratenko, O.S.; Romanyuk, V.R.
(Semiconductor Physics Quantum Electronics & Optoelectronics, 2003)
This work is aimed at optical characterization of thin Au films by multiple-angle-of-incidence reflectance ellipsometry at the fixed wavelength (632.8 nm) in standard and attenuated total reflection (ATR) modes in contact ...