Pashayev, A.M.; Tagiyev, B.G.; Madatov, R.S.; Gadzhieva, N.N.; Aliev, A.A.; Asadov, F.G.
(Вопросы атомной науки и техники, 2019)
For the first time, information on the surface relief of the layered GaS and doped GaS:Yb single crystals subjected to gamma-irradiation was obtained using atomic force microscopy (AFM) and Fourier-transform infrared ...