Voronov, D.L.; Zubarev, E.N.; Kondratenko, V.V.; Pershun, Yu.P.; Sevryukova, V.A.; Bugayev, Ye.A.
(Functional Materials, 2008)
Kinetics of phase formation Sc/Si multilayers and Si/Sc/Si three-layers within the temperature range of 130-400°C has been studied by cross-sectional transmission electron microscopy and small-angle X-ray reflectometry. ...