Konovalov, V.G.; Bondarenko, V.N.; Ryzhkov, I.V.; Shapoval, A.N.; Shtan’, A.F.; Skoryk, O.O.; Solodovchenko, S.I.; Voitsenya, V.S.
(Вопросы атомной науки и техники, 2012)
It was shown that a light source with edge sharpness can be used for very sensitive measurements of the ratio of specular and diffusive components of reflectance of the mirror subjected to sputtering.