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Перегляд Semicond. Physics Quantum Electronics & Optoelectronics, 2009, № 2 за назвою

Репозиторій DSpace/Manakin

Перегляд Semicond. Physics Quantum Electronics & Optoelectronics, 2009, № 2 за назвою

Сортувати за: Порядок: Результатів:

  • Savenkov, S.N.; Oberemok, Ye.A.; Yakubchak, V.V.; Barchuk, О.I. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2009)
    The paper is devoted to the analysis of light scattering by inhomogeneous circular birefringent media in a single scattering case. The object under investigation is a circular birefringent crystalline slab with surface ...
  • Makhniy, V.P.; Skrypnyk, N.V.; Boyko, Yu.N. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2009)
    Analyzed in this paper is the influence of various modifications of substrate surface in n-CdTe single crystals (laser, thermal and photothermal) on electric and photoelectric properties of diode structures based on them.
  • Kaganovich, E.B.; Kizyak, I.M.; Kudryavtsev, A.A.; Manoilov, E.G. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2009)
    Photoluminescent porous films of aluminum oxide containing gold nanoparticles were prepared using pulse laser deposition from backward flow of particles from erosion torch. Measurements of time-resolved photoluminescence ...
  • Kulish, M.R.; Malysh, N.I. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2009)
    . Formulated in this work are the requirements to the Fresnel rhomb used for light polarization control of high-power lasers. Technical parameters of the rhomb have been given. The calibration procedure of the Fresnel ...
  • Vlaskin, V.; Vlaskina, S.; Berezhinsky, L.; Svechnikov, G. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2009)
    The reliability of AC thick-film EL devices has been studied. The AC thickfilm EL devices were fabricated by Novatech Inc. using the industrial print screen technology. The analysis of reasons for failure has been proposed. ...
  • Maksimenko, L.S.; Matyash, I.E.; Rudenko, S.P.; Serdega, B.K. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2009)
    The internal reflection of nanosized gold cluster films was studied using the technique of polarization modulation of electromagnetic radiation in the Kretschmann geometry. We measured the reflection coefficients Rs and ...

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