Gudymenko, O.Yo.; Kladko, V.P.; Yefanov, O.M.; Slobodian, M.V.; Polischuk, Yu.S.; Krasilnik, Z.F.; Lobanov, D.V.; Novikov, А.А.
(Semiconductor Physics Quantum Electronics & Optoelectronics, 2011)
Using high-resolution X-ray diffraction (HRXRD), we have investigated
lateral ordering the nanoislands formed from Ge wetting layer of various thicknesses
deposited on a strained Si₁₋xGex sublayer. We observed that the ...