Lytvyn, P.M.; Lytvyn, O.S.; Dyachyns’ka, O.M.; Grytsenko, K.P.; Schrader, S.; Prokopenko, I.V.
(Semiconductor Physics Quantum Electronics & Optoelectronics, 2012)
The paper presents a study on modeling the mechanical interaction between the tip of a
scanning atomic force microscope (AFM) and surfaces of various types, which makes it
possible to optimize parameters and modes for ...