Zubrilin, N.G.; Pavlov, I.A.; Baschenko, S.M.; Tkachenko, O.M.
(Semiconductor Physics Quantum Electronics & Optoelectronics, 2016)
The technique for precise measurements of wavelengths in the range around 222 nm (45030 cm⁻¹) has been presented. The reciprocal linear dispersion of the spectrometer was 0.529 Å/mm. The measurements were made in the second ...