Перегляд за автором "Zabudsky, V."

Сортувати за: Порядок: Результатів:

  • Measuring system for testing electrical parameters of EMCCDs of various formats 
    Zabudsky, V.; Golenkov, O.; Rikhalsky, O.; Reva, V.; Korinets, S.; Dukhnin, S.; Mytiai, R. (Технология и конструирование в электронной аппаратуре, 2019)
    This article describes the developed equipment that allows measuring the photoelectrical parameters of multielement photodetectors, specifically various formats of EMCCD (electron multiplying charge-coupled device) chips. ...
  • Zero bias terahertz and subterahertz detector operating at room temperature 
    Momot, N.; Zabudsky, V.; Tsybrii, Z.; Apats’ka, M.; Smoliy, M.; Dmytruk, N. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2010)
    In this paper, the experimental study of the terahertz and subterahertz hot electron bolometer based on narrow-gap semiconductor compound Hg₁₋xCdxTe is presented. The measurements were performed in the temperature range ...