Перегляд за автором "Rozouvan, T.S."

Результати 1-2 з 2

Influence of the surface roughness and oxide surface layer onto Si optical constants measured by the ellipsometry technique

Rozouvan, T.S.; Poperenko, L.V.; Shaykevich, I.A. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2015)

Si crystal surface after chemical etching was studied using ellipsometry, atomic force microscopy and scanning tunneling microscopy. The ellipsometric parameters as functions of light incidence angles at two light wavelengths ...
Optical properties of graphene film growing on a thin copper layer

Rozouvan, T.S.; Poperenko, L.V.; Kravets, V.G.; Shaykevich, I.A. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2016)

Optical properties and surface structure of graphene films grown on thin 1-μm copper layer using the chemical vapor deposition method were investigated applying spectroscopic ellipsometry and nanoscopic measurements. ...

Результати 1-2 з 2

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